The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 1989
Filed:
Nov. 24, 1987
Candice H Brown, San Jose, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A high performance test fixture is disclosed for testing integrated circuit chips which permits high throughput and good heat dissipation wherein flexible contact apparatus carried by said test fixture are urged into contact with the corresponding contacts on an integrated circuit chip using a pressurizable chamber wherein the flexible contact member carrying the test fixture contacts constitutes one wall of the chamber whereby pressurizing the chamber urges the flexible contact member and the contacts carried thereon against the chip. In a preferred embodiment, the chamber is pressurized by a cooling gas which compensates for the heat generated during the testing; and the test fixture is provided with apparatus to vibrate the contacts thereon in a lateral direction over the chip contacts to thereby remove oxide on the chip contacts to ensure a better electrical contact between the chip contacts and the test fixture contacts.