The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1989

Filed:

Jun. 04, 1987
Applicant:
Inventor:

John W Miller, Toledo, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250563 ; 250562 ; 358106 ;
Abstract

A system for line scan processing video signals from a linear array of photoelectric cells so that the signals for individual cells and individual scan sweep are selectively utilized according to sweep number and cell numbers. A signal window is defined for each sweep individually at a predetermined cell for a beginning of the effective video signal and is terminated at another predetermined cell for the end of the effective video signal so that the video signal is processed for only that portion of each sweep covering the area of interest. In optical inspection of an article the significance of changes in the ratio of light intensity at particular cells from the background light intensity is adjusted by sweep and cell number so that such changes which are predictable in certain locations on the article must exceed threshold levels which are different than for other locations. This enables compensation in the inspection of a number of similar articles for regularly occurring marks on the areas of inspection for those articles.


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