The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1989

Filed:

Nov. 13, 1986
Applicant:
Inventors:

Yakichi Higo, Yagumo, Meguro-ku, Tokyo, JP;

Shigetomo Nunomura, Kawasaki, JP;

Masashi Ono, Kawasaki, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128773 ; 128739 ; 73587 ;
Abstract

In a functional evaluation device for use in evaluating functional degradation of an artificial device buried in a living body, frequency zones of acoustic emission are detected by the use of the fact that the functional degradation brings about variation of the frequency zones. The acoustic emission may be measured at two different positions adjacent to the artificial device so as to detect an arrival time difference of the acoustic emission and to thereby locate the functional degradation. The acoustic emission is therefore picked up by a pair of transducers placed at the two positions and is processed by a processing circuit for detecting whether or not the functional degradation takes place and by a determining circuit for locating the functional degradation.


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