The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1989
Filed:
Apr. 20, 1987
Applicant:
Inventors:
Martin Annis, Cambridge, MA (US);
Paul Bjorkholm, Sharon, MA (US);
Assignee:
American Science and Engineering, Inc., Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 87 ; 378 58 ; 378 44 ; 250302 ;
Abstract
A method of imaging for enhancing detection of cracks or flaws in an object using penetrating radiation is disclosed wherein a contrast medium is applied to an object before illumination and scatter radiation is detected from the object. This is achieved by employing a flying spot scanner and a backscatter imaging technique allowing imaging of objects which are not completely accessible, e.g. imaging the object where only one side accessible.