The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1989
Filed:
Apr. 20, 1987
Applicant:
Inventors:
David Cheng, San Jose, CA (US);
Wesley W Zhang, Burlingame, CA (US);
Assignee:
Applied Materials, Inc., Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G21K / ; B65H / ;
U.S. Cl.
CPC ...
36416701 ; 2504421 ; 318640 ; 364513 ; 364559 ; 414225 ; 901-6 ; 901 47 ;
Abstract
A system and method for determining the precise location of a moving object such as a semiconductor wafer relative to a destination position, using an array of optical sensors positioned along an axis generally transverse to the path of movement of the wafer. The sensor trigger points along the path of movement are used to calculate the center position of the wafer relative to the destination position.
Quick Actions:
Cheng, David. (1989). System and method for detecting the center of an integrated circuit wafer (U.S. Patent No. 4819167). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4819167
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile