The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1989
Filed:
Feb. 13, 1987
Applicant:
Inventor:
Shigeo Kanamori, Kobe, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738655 ; 364555 ;
Abstract
A method for measuring and analyzing particle size distribution of extremely fine particles, such as blood corpuscles and cells, comprises collecting analyzing particle size distribution from the instrument, setting an estimated distribution theoretically, comparing between the two distributions, determining the difference therebetween, and making the difference a characteristic parameter for the analyzing particle size distribution.
Kanamori, Shigeo. (1989). Particle size distribution analysis (U.S. Patent No. 4817446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4817446
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile