The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1989

Filed:

Jun. 19, 1986
Applicant:
Inventors:

Jacques Meyer, Sartrouville, FR;

Jean M Bouchet, Ville D'Avray, FR;

Jean P Lande, Saclas, FR;

Assignee:

Framatome, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ; H04J / ;
U.S. Cl.
CPC ...
455603 ; 370-3 ; 455612 ;
Abstract

The industrial installation comprises an active zone (III) with which there are associated means for measurement and for command and a control position (I) separated from the active zone. Means for measurement, for control and for command (15) located in the active zone are supplied with luminous radiations, from the control position, through an optical fibre (8) joining the active zone to the control position. Radiation having a broad spectral band is emitted in the fiber (8) from the control position (I) and then divided in order to obtain unitary radiations for supplying each of the means (15). The invention applies to nuclear reactors.


Find Patent Forward Citations

Meyer, Jacques. (1989). Process and apparatus for control and monitoring of installation by (U.S. Patent No. 4817202). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4817202

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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