The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1989

Filed:

May. 21, 1986
Applicant:
Inventors:

Donald O Thompson, Ames, IA (US);

Samuel J Wormley, Ames, IA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
364507 ; 73598 ; 73600 ; 73602 ;
Abstract

A multi-viewing ultrasound transducer acquisition system for non-destructive evaluation, flaw detection and flaw reconstruction in materials. A multiple transducer assembly includes a central transducer surrounded by a plurality of perimeter transducers, each perimeter transducer having an axis of transmission which can be angularly oriented with respect to the axis of transmission of the central transducer to intersect the axis of transmission of the central transducer. A control apparatus automatically and remotely positions the transducer assembly with respect to the material by a positioning apparatus and adjusts the pe


Find Patent Forward Citations

Thompson, Donald. (1989). Non-destructive evaluation means and method of flaw reconstruction (U.S. Patent No. 4817016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4817016

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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