Contactor and probe assembly for electrical test apparatus

Abstract

Substrates are tested by conductive, individually plug replaceable, buckling beam probes in a probe pattern to engage the circuitry on the substrate. When probes engage the substrate, they buckle as a given engaging force is exceeded. Each probe socket is adapted to releasably retain a probe inserted in its socket. The probes and the probe sockets are axially mounted in a probe housing. A probe in a socket has a first end oriented to engage the circuitry and a second end is releasably engaged in a sleeve in its socket. the probe pattern is displayed radially. Guides have guide pins mounted in the probe housing. The pins cooperate with companion guide ways with contours such as slots. The guide ways in the substrate engaging member, and an actuator move the substrate engaging member relative to the guide pins along the contours of the guide ways. Cams are affixed to the probe housing approximately 180 degrees from one another, with a cam follower movably mounted relative to the cams so the cam follower engages the cams, and the follower is driven relative to the cams. The substrate engaging member either shrouds the first ends of the probes, or exposes the first ends of the probes to engage the circuitry.