The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1989
Filed:
May. 29, 1986
Bruce K Flint, Wolfebro, NH (US);
Robert D Fancy, Oakdale, MA (US);
Robert V Jarratt, Jr, Groton, MA (US);
Acton Research Corporation, Acton, MA (US);
Abstract
A monochromatic spectrometer for evaluating contamination changes in the surface condition of lenses, reflectors and similar optical samples in the vacuum of a space mission includes a vacuum ultraviolet beam source redirected from a dispersion grating through a test station and reflected from a mirror to a photodetector. A rotatable carrier supports two or more optical samples, both transmissive and reflective and selectively positions one sample at a time at the test station so that the selected sample modifies the VUV beam according to its surface condition. The mirror is movable from a first position in which it reflects the beam transmitted through a sample to second position in which it reflects the beam reflected from a sample. The sample condition measured by the photodetector, the position of the rotatable carrier and mission elapsed time are recorded in a memory for re-transmission or later read out.