The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 1989
Filed:
Aug. 11, 1987
Joseph P Malloy, Freeport, PA (US);
William Baldwin, Verona, PA (US);
Oberg Industries, Inc., Freeport, PA (US);
Abstract
A plurality of individual frames or stampings provided in a sheet strip material by a stamping device are passed in proximity to a sensing device. As each individual frame or stamping is passed in proximity to the sensing device, the sensing device provides a voltage signal to a controller. The voltage signal is proportional to the amount of, or mass of, metallic material in each frame or stamping and the distance between the frame or stamping and the sensing device. The controller generates an individual waveform from the voltage signal for each frame passed in proximity to the sensing device. Each individual waveform is a function of the position of the movable portion of the stamping device for one cycle. As the plurality of individual frames are passed in proximity to the sensing device, a plurality of individual waveforms are generated within the controller. The waveforms are compared within the controller to detect a deviation between waveforms. A deviation between waveforms indicates a sheet strip material misfeed condition within the stamping device. If a sheet strip material misfeed condition is detected, the controller provides a signal to the stamping device to initiate stoppage of ths stamping device. If desired, the plurality of individual waveforms may also be compared within the controller to detect a deviation in the configuration of the frames or stampings produced by the stamping device from a desired frame or stamping configuration.