The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 1989
Filed:
Mar. 27, 1987
David M Boyd, Palmyra, PA (US);
Daniel L Barwick, Palmyra, PA (US);
Dennis H Chestnut, Harrisburg, PA (US);
Timothy W Jones, Lancaster, PA (US);
Douglas M Walburn, Harrisburg, PA (US);
Larry J Wilt, Harrisburg, PA (US);
AMP Incorporated, Harrisburg, PA (US);
Abstract
A thickness monitoring system for measuring the thickness of layer disposed on both sides of a two sided strip includes a thickness measuring device, a first set of guide rollers mounted to guide the strip past the thickness measuring device along a first path, a set of guide pulleys mounted to invert the strip and to offset the strip laterally with respect to the first path, and a second set of guide rollers which guide the inverted strip past the thickness measuring device along the second path. The thickness measuring device is mounted for movement along a third path which is transverse to the first and second paths to allow the thickness measuring device to monitor either side of the strip by positioning the measuring device in alignment with the respective one of the first and second paths.