The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1989
Filed:
Feb. 20, 1987
Applicant:
Inventors:
Hideshi Maeno, Itami, JP;
Tetsuo Tada, Itami, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 27 ; 371 21 ;
Abstract
A semiconductor test device including a function test algorithmic pattern generator which comprises: an ALU unit with shift-in function for conducting a predetermined arithmetical and logical operation against the base data or the output of an ALU output register; the ALU output register being designed to store the output of the ALU and output a function test algorithmic pattern; and a parity detection circuit which conducts a parity detection against an arbitrary group of bits of the ALU output register, and the detection output is input into a shift-in input of the ALU.