The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 1989

Filed:

Jan. 22, 1988
Applicant:
Inventors:

Hans-Georg Knop, Heikendorf, DE;

Jorg Schulz-Hennig, Heikendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358285 ; 358294 ; 350266 ;
Abstract

Diaphragm arrangement for point-by-point electro-optical scanning of originals, whereby the scan point is composed of a central main field and of a surrounding field surrounding the main field. A diaphragm for scanning the main field and a second diaphragm for scanning the surrounding field are provided, whereby the sizes of the diaphragm apertures of the two diaphragms are continuously adjustable independently of one another, whereby the diaphragm apertures of the first diaphragm define the size of the main field and, thus, the scanning fineness and the inside diameter of the surrounding field, and the diaphragm aperture of the second diaphragm defines the size of the surrounding field, and whereby the size relationship between main field and surrounding field is continuously adjustable on the basis of the independent and continuous adjustment of the two diaphragm apertures.


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