The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 1989

Filed:

Dec. 22, 1987
Applicant:
Inventor:

Johannes H Den Boef, Eindhoven, NL;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

The invention relates to a method of making NMR images (density distributions, location-dependent spectroscopy) utilizing two alternating gradient fields whose gradient directions are mutually perpendicular. Thus, a two-dimensional 'plane' in the 3-D image frequency space can be filled with a uniform density of measurement points. Per FID signal more signal samples can be taken, resulting in a substantial reduction of the entire measurement procedure for a 3-D image. This method is very suitable for imaging of 3-D density distributions, 2-D or 3-D spectroscopy etc. The periods and the amplitudes of the alternating gradient fields are preferably the same; however, these fields are preferably phase-shifted 90.degree. with respect to one another.


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