The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 1989

Filed:

Nov. 04, 1987
Applicant:
Inventors:

Miha Fuderer, Both of Eindhoven, NL;

Johannes J Cuppen, Both of Eindhoven, NL;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324307 ; 324318 ;
Abstract

In MRI (Magnetic Resonance Imaging), the signal-to-noise ratio with nuclear magnetic resonance signals received by a surface coil from an excited body is considerably larger than with corresponding signals received by a body coil in the relevant region. The sensitivity pattern of a surface coil is very non-uniform, however. By correction of a reconstructed image from MR signals received by a surface coil by a corresponding image from MR signals received by a body coil, in which event the surface coil has an arbitrary shape and occupies an arbitrary position with respect to the body, the non-uniformity in the surface coil image is brought back to the uniformity of the body coil image.


Find Patent Forward Citations

Fuderer, Miha. (1989). Method and arrangement for determining a corrected mri surface coil image (U.S. Patent No. 4812753). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4812753

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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