The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 1989

Filed:

Jan. 21, 1987
Applicant:
Inventors:

Moshe Nazarathy, Mountain View, CA (US);

Steven A Newton, Belmont, CA (US);

Scott H Foster, LaHonda, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ; 364579 ;
Abstract

A method of dynamically changing the measurement window and operating parameters of the instrument, based on intermediate results, in order to minimize the total time required to make a complete measurement. Also, a method of combining partial results from subwindows into a final result to be displayed that has not been corrupted by variation in system response due to time-varying operating parameters.


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