The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1989
Filed:
Jul. 24, 1987
Vineet Dujari, Sunnyvale, CA (US);
Nicos S Syrimis, Santa Clara, CA (US);
Douglas G Gray, Santa Clara, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A novel technique for skipping defects on a magnetic or writable optical disk is described. The technique includes a sector format comprising a header (24) and data area (28), wherein the data area can include one or more 'bad areas' (108, 116) which will be skipped when data is being written to or read from the sector. The bad areas are variable in size and may be located anywhere in the data area, including in an EDAC. The header includes a defect descriptor (48) comprising a defect pointer (70, 72) for each of the bad areas supported. Each defect pointer contains a value (74, 78) indicating the number of bytes in the good data area (106, 114) preceding the bad area pointed to by the defect pointer, and a value (76, 80) indicating the number of bytes in the bad area. The value indicating the number of bytes in a good area is set to a value indicating a number of bytes at least as large as the sector size if there is no subsequent bad area in the data area.