The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1989
Filed:
May. 17, 1988
Takeshi Takahashi, Kyobashi, JP;
Masatake Nakamura, Kyobashi, JP;
Yoshiji Yabana, Kyobashi, JP;
Toshiyuki Ishikawa, Kyobashi, JP;
Koji Nagata, Kyobashi, JP;
Shimizu Construction Co., Ltd., Tokyo, JP;
Abstract
Disclosed is a radio wave leakage diagnosing system for use in an intelligent building which is constructed using an electromagnetic shielding material for the skeleton and openings such as windows and doorways so that the whole of the building is formed into an electromagnetic shielding structure. The system has a radio wave detector disposed outside the building for detecting a predetermined radio wave transmitted from each floor of the building, so that a floor, togethere with a specific position, where there is a leakage of radio wave is detected on the basis of the intensity of the detected radio wave. With this arrangement, a predetermined radio wave is transmitted from each floor of the building and the transmitted radio wave is detected by the radio wave detector. Accordingly, the degree at which the radio wave leaks from each floor can be checked on the basis of the intensity of the received radio wave, and when the electromagnetic shielding is broken, the floor and specific position where the shielding abnormality occurs can be found on the basis of the intensity of the received radio wave. When the electromagnetic shielding performance has deteriorated, it is possible to know the degree of deterioration by making a comparison with the diagnostic results obtained in the past.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile