The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1989
Filed:
Jul. 22, 1987
Applicant:
Inventors:
Takeo Murakoshi, Katsuta, JP;
Sadao Minakawa, Mito, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ; G01J / ;
U.S. Cl.
CPC ...
250225 ; 250226 ; 356448 ; 356432 ;
Abstract
Light irradiated to a sample is detected by a detector in order to measure the optical properties of the sample. The image of a minute virtual light source for the light is focused in the neighborhood of the measuring face of the sample by a first optical system arranged between the light source and the sample. The light outgoing from the sample is incident to the detector by way of a second optical system arranged between the sample and the detector and having conjugate points in the neighborhood of the measuring face of the sample and of the light receiving point of the detector.