The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1989
Filed:
Apr. 29, 1988
Kohichi Okada, Tokyo, JP;
Kazutoshi Takagi, Tokyo, JP;
Kabushiki Kaisha Naitsu, Tokyo, JP;
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
The invention provides a binocular indirect ophthalmoscope in which light reflected from an eye under test is split and guided to left and right oculars (7, 8). Left and right mirrors (10, 11) for directing the split light to the left and right oculars being laterally movable about the optical axes (01, 02) of the oculars and toward and away from each other. The mirrors are arranged to follow the mutual approaching and receding of the oculars but the oculars will not follow the mutual approaching and receding of the mirrors, whereby the distance between these mirrors can be adjusted separately from the distance between the optical axes of the oculars. Such arrangement allows the operator to shift the light beams for observation (OFL, OFR) to appropriate positions where they are not interrupted by the iris, and thus allows sufficient and widely ranging stereoscopic observation, irrespective of the size of the pupil diameter of the eye under test or OF the direction of observation. Further, the distance between the oculars can easily and rapidly be adjusted for adaptation to different operators having different eye-to-eye distances.