The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1989

Filed:

Dec. 02, 1986
Applicant:
Inventors:

Takehiko Kitamori, Hitachi, JP;

Haruo Fujimori, Hitachi, JP;

Kazumichi Suzuki, Mito, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504581 ; 2504591 ; 356 73 ; 356432 ;
Abstract

A method of and an apparatus for simultaneous determination of constituents are disclosed in which a solution containing trace constituents is irradiated with an intensity-modulated electromagnetic wave having a predetermined wavelength, a photoacoustic signal and radiation from the electromagnetic-wave irradiation trace constituents are detected together with the emission spectrum thereof. The concentrations of the trace constituents are calculated from the magnitude of the photoacoustic signal, the intensity of the radiation, and calibration curves each formed for known concentrations of one of the trace constituents, and the trace constituents are identified by the above emission spectrum.


Find Patent Forward Citations

Kitamori, Takehiko. (1989). Method of and apparatus for simultaneous determination (U.S. Patent No. 4808828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4808828

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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