The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1989

Filed:

Dec. 29, 1986
Applicant:
Inventors:

Masahiko Shibayama, Shiga, JP;

Umekichi Kai, Kyoto, JP;

Hideki Yamamoto, Kameoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01N / ;
U.S. Cl.
CPC ...
364552 ; 364507 ; 364473 ; 364550 ; 340674 ; 356240 ;
Abstract

An inspection controller for an object includes a plurality of sensors for providing a set of input signal states representing characteristics of the object, a plurality of output terminals, a memory for storing a set of output signal states corresponding to each possible set of input signal states of the sensors, and a control device for selecting a set of output signal states stored in the memory and producing a set of output signal states at the output terminals corresponding to a set of the input states. A teaching command device is also included for commanding the writing of a set of output signal states corresponding to a predetermined set of input signal states in the memory; and a second control device for writing into the memory the set of input signal states obtained from the sensors and the output signal states on the output terminals selected by the output terminal selecting device in such a manner that the two sets of data correspond to each other according to the status of the teaching command device, the selecting device, and the write command device.


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