The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1989
Filed:
Dec. 02, 1987
Jaroslav M Hvezda, Nepean, CA;
Richard J Middlehurst, Kanata, CA;
Northern Telecom Limited, Montreal, CA;
Abstract
An adjustable quick-mount test probe assembly for use in circuit testing. The test probe assembly provides a convenient means for testing printed circuit boards containing Very Large Scale Integrated (VLSI) components and high density interconnect substrates. This is due to its versatility in terms of positioning and its use of replaceable, 'off-the-shelf' test probe tips. The test probe assembly provides a means of quickly connecting test clips from a test equipment unit to a circuit board, as well as providing a means of neatly arranging test leads to avoid the possibility of entanglement and reducing strain on the test probe. Test set-up time is greatly reduced, and confidence of test set-up integrity is increased.