The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1989
Filed:
Apr. 09, 1987
Lothar Sebastian, Bochum, DE;
Kuno Guse, Dortmund, DE;
Bochumer Eisenhutte Heintzmann GmbH & Co. KG, Bochum, DE;
Abstract
An apparatus for the contactless measurement of geometrical dimensions includes a light source emitting a light beam, a first deflector deflecting the light beam at an angle toward an object to be measured, a receiver receiving the light beam and a second deflector for deflecting the light beam reflected by the object toward the receiver. The second deflector rotates about an axis extending perpendicularly to the light beam reflected by the object. The axis of the light beam emitted by the light source extends parallel to the axis of rotation of the second deflector. The light beam conducted to the receiver extends coaxially to the axis or rotation of the second deflector. This apparatus requires no calibration, but only an adjustment. For measuring a distance it is sufficient if only the second deflector rotates. If both deflectors rotate, the second deflector must rotate at a substantially higher rate of rotation than the first deflector. The first deflector is vertically adjustable and lockable. Also, the unit formed by the light source, the two deflectors and the receiver may be rotatable about an axis and movable in longitudinal direction of the axis extending parallel to the axis of rotation of the second deflector.