The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1989
Filed:
Sep. 04, 1986
Klaus Klingenbeck, Hessdorf, DE;
Judith Regn, Nuremberg, DE;
Siemens Aktiengesellschaft, Berlin and Munich, DE;
Abstract
A method and apparatus for identifying the distribution of the dielectric constants in an object employ radiation emitted by a microwave transmitter directed at the object, which radiation is received by a microwave detector array. The dielectric constant distribution is calculated in a computer from the output signal of the detector array, and is represented on a monitor. The transmitted and scattered radiation is acquired by the array in a prescribed volume in terms of amplitude and phase. For this purpose, the array has a surface with detector elements thereon which is linearly displaceable in a direction toward the microwave transmitter in steps along a selected path. At each step, the incoming radiation is identified in terms of amplitude and phase at a plurality of measuring locations, the number of measuring locations corresponding to the number of individual detector elements within the array. This measuring phase is thereafter combined with a calibration phase for further processing.