The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1989
Filed:
Jun. 10, 1987
Applicant:
Inventor:
Frank S Krufka, Mount Joy, PA (US);
Assignee:
RCA Licensing Corp., Princeton, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
364560 ; 358107 ; 356384 ;
Abstract
The major/minor dimensions of elliptical elements are measured by simultaneously scanning both dimensions of the elements and arranging the data in a matrix for each of the dimensions. A first preselected number of the largest elements are arranged or averaged for one dimension to obtain an average for one of the dimensions. A second predetermined number of largest elements are averaged for the other dimension to obtain an average for the other dimension. The measured dimensions are compared with upper and lower limits to verify the acceptability of the dimensions.