The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1989

Filed:

Jun. 03, 1985
Applicant:
Inventors:

Kenneth J Pol, Saginaw, MI (US);

James F Foster, Lansing, MI (US);

Jack D Gyger, Charlotte, MI (US);

Lawrence P Hyland, Portland, MI (US);

Assignee:

Roberts Corporation, Lansing, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B65H / ; B65H / ;
U.S. Cl.
CPC ...
271 11 ; 271 91 ; 271263 ; 414737 ; 4147954 ;
Abstract

A measuring device (60) measures the value (t) of a chosen parameter (thickness) of what has been lifted by a lifting assembly (40) from a stack of sheets (1) of material and allows the lifted material to be moved from the stack when the value is in a predetermined relationship to a reference value (T). One (45a) of a plurality of selectively releasable members (45) on the lifting assembly (40) is moveable in two horizontal directions to locate a sheet attached to the one releaseable members (45a) against locating pins (5, 6) on the work table (3) of the punch press (4). The entire system may be operated automatically by a controller (90).


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