The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1989
Filed:
Apr. 30, 1987
William B Kerfoot, Falmouth, MA (US);
K-V Associates, Inc., Falmouth, MA (US);
Abstract
A novel apparatus for a method of subsurface sampling which includes a sampling probe having a sample inlet in fluid communication with a sample outlet connected to a tube through which a subsurface medium can be conducted from a desired subsurface point below the earth's surface to a second point thereabove, one of a number of impact sleeves covers the sample inlet, while the sample inlet is covered by the lowermost of the impact sleeves, the probe is driven to a desired subsurface point and during the latter or when the subsurface point is reached, the sample inlet is uncovered thereby creating an uncontaminated flow path for a liquid or vapor sample medium at the desired subsurface point which can be transferred above surface for monitoring/analyzing. The sample inlets can be selectively uncovered during vertical descent for progressive sensing/analyzing, or alternatively the sample inlets can be themselves surrounded by a slotted impact sleeve to achieve vertical sampling without impact sleeve retraction.