The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1989
Filed:
May. 11, 1987
Osamu Harada, Atsugi, JP;
Akio Kojima, Hadano, JP;
Souhei Ikeda, Ayase, JP;
Yoshihisa Watanabe, Hadano, JP;
Yoshihisa Tsuji, Hadano, JP;
Hitachi, Ltd, Tokyo, JP;
Hitachi Computer Engineering Co., Ltd, Kanagawa, JP;
Abstract
An inspection device for inspecting projections of a part which can be applied to a variety of parts having projections on the surface thereof such as leads of electronic parts having varying shapes. The inspection device includes a member having a two-dimensional surface to which projections of the part are two-dimensionally pressed at a predetermined pressure, and an arrangement for detecting a pressure distribution pattern on the surface of the member as well as a converter for converting the detected pattern to two-dimensional pattern information. Further, a memory is provided for storing a reference pattern of the projections of the part so that inspection may be effected by comparing the reference pattern with the converted two-dimensional pattern information.