The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1989
Filed:
Feb. 25, 1986
Douglas S Steele, West Chester, OH (US);
Larry C Howington, West Chester, OH (US);
James W Schuler, Oxford, OH (US);
Joseph J Sostarich, Fairfield, OH (US);
Charles R Wojciechowski, West Chester, OH (US);
Theodore W Sippel, Cincinnati, OH (US);
Joseph M Portaz, Hamilton, OH (US);
Ralph G Isaacs, Cincinnati, OH (US);
Henry J Scudder, III, Medford, MA (US);
Thomas G Kincaid, Lexington, MA (US);
Kristina H Hedengren, Schenectady, NY (US);
Rudolph A Koegl, Niskayuna, NY (US);
John P Keaveney, Schenectady, NY (US);
Joseph Czechowski, III, Clifton Park, NY (US);
John R Brehm, Cincinnati, OH (US);
James M Brown, Jr, Albany, NY (US);
David W Oliver, Schenectady, NY (US);
George E Williams, Schenectady, NY (US);
Richard D Miller, Schenectady, NY (US);
General Electric Company, Cincinnati, OH (US);
Abstract
An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.