The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 1989

Filed:

May. 28, 1987
Applicant:
Inventor:

Pierre-Henri Boutigny, Epinay-sous-Senart, FR;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324130 ; 324 725 ; 341118 ;
Abstract

A high frequency probe for a logic analyzer adapted to operate with different types of logic circuits, and signals which may or may not be superimposed on a dc component. After an input capacitance, a high frequency amplifier feeds both an output terminal and a compensator circuit which compares the deviation between low frequency or dc components appearing at the input and output terminals, and compensates for the deviation by reinjecting a signal at the input of the high frequency amplifier. Variable attenuation may also be also be included between the high frequency amplifier and the output terminal.


Find Patent Forward Citations

Boutigny, Pierre-Henri. (1989). Input circuit for a probe of a logic analyser and probe and logic (U.S. Patent No. 4803423). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4803423

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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