The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1989
Filed:
Oct. 14, 1986
Applicant:
Inventor:
Ralph H Hill, Jr, San Antonio, TX (US);
Assignee:
Southwest Research Institute, San Antonio, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356318 ; 356417 ; 2504591 ;
Abstract
An optical inspection system for using laser-induced luminescence to detect deterioration of a polymer-based material. The inspection system comprises an excitation means for illuminating a specimen of the polymer material to cause it to produce fluorescent radiation. The spectral representation of the fluorescence produced by the specimen is compared to the spectrum of a reference sample of known quality in order to obtain an indication of the physical characteristics of the specimen.