The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1989
Filed:
May. 26, 1988
Walter F Bachelder, Ft. Falonga, NY (US);
Maurice Frankel, Farmingville, NY (US);
Peter Fiore, Mt. Sinai, NY (US);
Testing Machines Inc., Amityville, NY (US);
Abstract
An impact testing apparatus and process are provided. The apparatus comprises a thickness verifier to measure the thickness of each specimen. The apparatus further comprises a notcher and a notch verifier which are operative to first cut notches in a test group of specimens and to subsequently verify the accuracy of the notches. The apparatus further comprises a robotic gripper to sequentially deliver specimens to a vise for impact testing. The impact tester of the apparatus is operative to automatically assess the impact on each specimen. Additionally, the impact tester comprises optical sensors to assess the type of break of each specimen subjected to the impact test. A control unit receives input data from the various components of the apparatus, analyzes the data and prepares test reports.