The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 1989

Filed:

Sep. 01, 1987
Applicant:
Inventors:

Shohei Yamamoto, Tokyo, JP;

Yukito Kato, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G03F / ; G01N / ; G03B / ;
U.S. Cl.
CPC ...
364525 ; 364526 ; 36457107 ; 358 76 ; 358 80 ; 356408 ; 354426 ;
Abstract

An offset drift correction method for use in in a color film inspection apparatus includes the steps of; measuring the changes of various amounts of light at intervals of a predetermined amount of light as density signals by using a green standardized logarithmic-transforming curve; providing table data by shifting the green standardized logarithmic-transforming curve as to inputs in such a way that the changes become equal to one another; writing the table data in a green look-up table; measuring input signals for red and blue at intervals of the predetermined amount of light; and substituting the measured inputs with the table data of the shifted green standardized logarithmic-transforming curve at corresponding amounts of light.


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