The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 1989

Filed:

May. 11, 1987
Applicant:
Inventors:

Curtis A Birnbach, Bronx, NY (US);

Richard N Heese, Westmont, CA;

Assignee:

Quantum Diagnostics Ltd., Hauppauge, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
315-541 ; 315-5 ;
Abstract

A tunable millimeter wave source in which accelerated electrons are directed into a bending magnet and emit broadband radiation in the millimeter wavelength portion of the spectrum. The electrons are produced by an electron gun using a portion of the microwave energy output from a RF source. The remainder of the microwave energy from the RF source is used to drive an RF linear accelerator which accelerates the electrons and directs them into the bending magnet. An interferometer may be used to select radiation of a particular frequency from the broadband output of the source. In a second embodiment, the source is provided with a plurality of output apertures, and a plurality of respective interferometers are used to select radiation of a number of desired discrete frequencies.


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