The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1989
Filed:
Jul. 13, 1987
Applicant:
Inventors:
Gary N Burk, Columbus, OH (US);
Paul Williams, Columbus, OH (US);
Assignee:
Process Automation Business, Inc., Columbus, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250559 ; 250563 ; 250226 ;
Abstract
Disclosed are sheet inspection apparatus and methods for rapid, repetitive measurement of a quality attribute in each of a plurality of measurement zones of a continuously-manufactured sheet of material, wherein measurement is based on the interaction of one or more radiation wavelength bands with one or more constituents of the sheet. Simultaneous resolution of measurement zones is provided in both scanning and non-scanning applications.