The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1989
Filed:
Nov. 09, 1987
David A Rugaber, Butler, PA (US);
Richard N Maxson, Butler, PA (US);
American Glass Research, Inc., Butler, PA (US);
Abstract
Apparatus for transporting and inspecting containers includes an annealing lehr disposed on one side of a primary conveyor and a stacker having a reciprocating pusher bar adapted to transport containers from the primary conveyor into the annealing lehr. Inspection apparatus is positioned adjacent to the primary conveyor. The stacker pusher bar preferably has a series of gates which permit a predetermined container which is to be inspected to pass through the pusher bar when the pusher bar is moved toward the annealing lehr to deliver the other containers thereto. The gates may advantageously be slidable or rotatable and be operated on an individual basis by actuators. The inspection equipment may be provided with conveyors to transport the containers to be inspected from the primary conveyor to the inspection apparatus and to transport the inspected containers which pass inspection to the primary conveyor or annealing lehr. A forming machine which molds the containers is connected with the primary conveyor by means of a take-away conveyor. Inspection is accomplished at the hot end of the lehr. In another embodiment, the containers to be inspected are withdrawn from the take-away conveyor, inspected and if acceptable, delivered to the primary conveyor or directly to the lehr. An associated method is provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile