The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1989
Filed:
May. 30, 1985
Kyoichi Tatsuno, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A particle size measuring apparatus irradiates a number of particles to be measured with a laser beam, measures a light intensity pattern scattered by the particles to be measured, and calculates a relative particle size distribution of the particles to be measured from the measured value obtained. The apparatus has a laser unit, a collimator lens for collimating a laser beam from the laser unit into a parallel laser beam and irradiating the particles to be measured with the parallel laser beam, an optical shield, interposed between the collimator lens and the particles to be measured, for shielding scattered light by the collimator lens and allowing passage of only parallel components of the laser beam, a detecting section consisting of a plurality of optical fibers arranged at an equal distance from a measurement region and at predetermined scattering angles and photodetectors connected thereto, and an arithmetic operating circuit for calculating a relative particle size distribution of the particles to be measured from the scattered light intensity pattern detected by the detecting section.