The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1989
Filed:
Sep. 25, 1987
Thomas A Ballas, North Canton, OH (US);
William E Harbottle, North Canton, OH (US);
Russell W Keller, Stark County, OH (US);
The Timken Company, Canton, OH (US);
Abstract
A machine measures an object of generally circular cross-section by superimposing on the subject a cylindrical coordinate system having five axes, namely a vertical measuring axis Z, three radial axes R0, R120, R240 emanating at a common point along the measuring axis Z, and a rotational axis .theta. having its center at the measuring axis Z. The machine includes an elevating unit which supports the object with its axis generally parallel to the measuring axis Z and is further capable of moving the object parallel to the measuring axis Z as well as rotationally about the measuring axis Z along the rotational axis .theta.. A measuring device monitors the linear position of the object along the axis Z while another measuring device measures the angular position of the object along the rotational axis .theta.. In addition, the machine includes three measuring heads, there being one along each radial axes R0, R120, and R240, and each measuring head includes a base, a slide which is mounted on the base for movement parallel to the radial axis of its head, and a probe carried by the slide. The probe has a displaceable probe tip which bears against a surface on the object. Each measuring head has a measuring device for monitoring the position of its slide relative to the slide base and as well as another monitoring device which may be used to monitor the position of the probe tip relative to the slide along the radial axis R or the position of the probe tip parallel to the measuring axis Z. The machine scans the object by effecting relative movement between the object and probe tips parallel to one of the axes while at least one of the probe tips remains against the object, and by taking measurements at equally spaced intervals along another of the axes. Thus, it is possible to make an axial scan, a radial scan, a rotary scan along a circumferential surface or a rotary scan along an end surface.