The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 1989

Filed:

Sep. 13, 1985
Applicant:
Inventors:

Gary M Hieftje, Bloomington, IN (US);

David E Honigs, Brier, WA (US);

Thomas B Hirschfeld, Livermore, CA (US);

Assignee:

Indiana University Foundation, Bloomington, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250339 ; 250255 ;
Abstract

Methods are disclosed for quantifying physical properties of gaseous, liquid or solid samples. The near-infrared absorbance spectra of a representative field of calibration samples are measured and recorded using a spectrophotometer. The absorbance spectra of the calibration samples are evaluated by a row-reduction algorithm to determine which wavelengths in the near-infrared spectrum, and associated weighting constants, are statistically correlated to the physical property being quantified. The near-infrared absorbance of actual samples is then measured at each of the correlated wavelengths, and then corrected by the corresponding weighting constants. A reference value for the physical property being quantified is then computed from the corrected measure of the absorbance of the sample at each of the correlated wavelengths.


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