The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1989
Filed:
Feb. 05, 1987
Applicant:
Inventor:
Karl J Erb, Gossau, CH;
Assignee:
Mettler Instruments AG, Greifensee, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356374 ; 3312 / ; 3312 / ; 2502 / ;
Abstract
The method of measuring positions is based on tracking an interference pattern which is generated when line grids is different line densities are superimposed. According to the present method the line grid of an optical scale is projected onto a line grid formed by a plurality of adjacently arranged diodes, whereby digital switching elements are allocated to the photodiodes and are integrated with same on a common substrate and which compare pair-wise the intensities of adjacent diodes. An absolute measuring of positions proceeds by an additional coding of the line grid of the scale. The method has use in linear as well as curvilinear (angular) measuring of positions.