The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 1989

Filed:

Jan. 20, 1987
Applicant:
Inventors:

Jacques Bouteyre, Saint Medard en Jalles, FR;

Christian Le Floc'H, Blanquefort, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356347 ; 350 9624 ;
Abstract

This invention concerns a device for the non-destructive inspection of a part (6) by means of optical holography. This device includes a source (2) emitting a laser beam and a holographic camera (4) placed at a certain distance from the source (2) and close to the part to be inspected (6); the laser beam is transmitted from the source (2) to the camera (4) by means of a beam of sequenced optical fibers (8) suitable for transmitting a high-powered laser beam, while maintaining the coherence of space and time of this laser beam. The device is suitable for interferometry nondestructive inspection applications.


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