The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1989
Filed:
Jan. 09, 1987
Klaus Klingenbeck, Hessdorf, DE;
Rudolf Schittenhelm, Erlangen, DE;
Siemens Aktiengesellschaft, Berlin and Munich, DE;
Abstract
A method and apparatus for undertaking a non-contacting measurement of the three-dimensional temperature distribution in a non-uniform examination subject direct microwave radiation at the examination subject, detect the three-dimensional phase and amplitude of microwave radiation which is attenuated and scattered by the examination subject, and calculate the three-dimensional dielectric constant distribution in the examination subject on the bases of the detected phase and amplitude values. In a separate step the characteristic thermal radiation of object is measured, too. The three-dimensional temperature distribution of the examination subject is then calculated from both the three-dimensional dielectric constant distribution data and the characteristic thermal readiation data of a selected location.