The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 1989
Filed:
Mar. 13, 1987
Applicant:
Inventors:
Richard L Austin, Del Mar, CA (US);
Herbert J Otto, San Diego, CA (US);
Frank L Jones, San Diego, CA (US);
Assignee:
EG&G Gamma Scientific Incorporated, San Diego, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324409 ; 324404 ; 356406 ; 358218 ;
Abstract
An apparatus and method for measuring the spatial characteristics of color CRTs includes the scanning of an image of a white vertical line with a knife edge aperture and integrating the intensity values at each position of the knife edge. The centroids of the beams of the CRT are found by determining the X coordinants of the 50% points of the Y axis of the integral data, and the spatial line profiles are determined by differentiating the integral data. The integral data may be fitted to a Gaussian curve prior to analysis.