The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1989

Filed:

Mar. 14, 1988
Applicant:
Inventors:

William E Lower, Cincinnati, OH (US);

Glenn J Pogue, Cincinnati, OH (US);

Assignee:

Rotex, Inc., Cincinnati, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07B / ;
U.S. Cl.
CPC ...
209237 ; 209261 ; 209287 ; 209309 ; 209311 ;
Abstract

An apparatus for automatic screen analysis of a granular material in which the material is screened from a polygonal drum which is divided crosswise into at least two chambers by a transverse partition. A first chamber has progressively coarser screens on each of its faces except one, which has a downward slanting ramp for transferring the sample into a second chamber. Particles are transferred or chuted into the second chamber after they have been screened on all the screens of the first chamber. The second chamber has screens progressively coarser than those in the first chamber, for making more cuts. This construction increases the number of graded screening surfaces available without requiring greater drum length or more sides.


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