The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1989

Filed:

Apr. 16, 1987
Applicant:
Inventors:

Jean Comera, Gieres, FR;

Pierre Contamin, Claix, FR;

Jean-Jacques Favier, Grenoble, FR;

Guy Marquet, Seyssinet, FR;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C30B / ; C30B / ;
U.S. Cl.
CPC ...
1566161 ; 1566207 ; 156601 ; 422248 ; 422254 ;
Abstract

The present invention relates to a process and an apparatus for checking the supercooling of a monocrystal during its formation. There is a continuous measurement of the potential difference between one point of the forming crystal and one point of a solid part of the material separated from the liquid by a reference interface differing from the solidification front. This potential difference makes is possible to determine the temperature deviation due to the supercooling at the solidification front and the dopant concentration of the crystal being formed.


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