The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1989

Filed:

Jul. 15, 1987
Applicant:
Inventors:

Yasufumi Fukuma, Tokyo, JP;

Yoshinori Oana, Tokyo, JP;

Akihiro Arai, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351212 ; 351205 ;
Abstract

An ophthalmological measuring apparatus is disclosed. It comprises a projecting systems for projecting a target image to the cornea and retina of an eye to be tested, respectively, a measuring optical system for being introduced a corneal reflecting beam of light and a retina reflecting beam of light from the eye, a light receiving portion for receiving the corneal reflecting beam of light and the retina reflecting beam of light through the measuring optical system and photoelectrically transferring the same, an image displaying device for displaying an image of the anterior portion of the eye based on a signal from the light receiving portion, and a calculating device for calculating and measuring a corneal configuration and an eye refractive power of the eye to be tested based on the signals of the corneal reflecting beam of light and the retina reflecting beam of light detected by the light receiving portion.


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