The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 1989

Filed:

Jun. 02, 1986
Applicant:
Inventors:

Joseph A Boscove, Highland Beach, FL (US);

Hobart L Kurtz, Boca Raton, FL (US);

Jeffrey E Prince, Birmingham, MI (US);

William P Wiegand, Birmingham, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
36455101 ; 36443101 ; 73116 ;
Abstract

A computer based technician terminal is connected to a vehicle being serviced using an assembly line data link (ALDL) connection from an on-board computer. The data link provides status information and fault codes. The technician is led through various procedures. During set up, the technician connects an ALDL cable from the terminal to the vehicle, the vehicle indentification number (VIN) is entered and vehicle options are identified. A fault detection procedure (FDP) in the terminal detects vehicle malfunctions by interrogating data received (via the ALDL) from the on-board computer. A fault analysis procedure (FAP), using the fault codes from a table as arguments, does a sequential compare against the contents of a fault analysis table containing fault codes. In a fault sequencing procedure (FSP), for each fault code passed by the FAP, there is a list containing the name(s) of one or more isolation procedures. A fault isolation procedure (FIP) is provided for electrical or electronic components on the vehicle to perform a complete test of the related part using a multifunction test probe. Fault repair procedures guide the technician through the proper steps to accomplish the repair, replacement or adjustment required.


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