The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1989
Filed:
Feb. 11, 1988
Rebecca A Hart, Plymouth, MN (US);
Michael J Gawronski, Minneapolis, MN (US);
Honeywell, Inc., Minneapolis, MN (US);
Abstract
A microwave and millimeter wave hybrid or monolithic microstrip test probe assembly provides a noninvasive radio frequency test point in a microstrip circuit. The probe assembly comprises a microstrip coupler. (12) adjacent a microstrip line (10) in the circuit for sampling a small amount of microwave energy propagating along said microstrip line. A stripline circuit (20, 22 and 24) is connected to the microstrip coupler. The stripline circuit includes a pad area (24) and a probe (26) moveable to overlay the pad area. The probe forms a ground plane with respect to the pad area, and a coaxial line (34) has an outer conductor connected to the probe and an inner conductor projecting through a hole in the probe. The probe assembly provides an RF test point within a microstrip circuit which allows an accurate, calibrated and repeatable means of sampling a microstrip signal while not affecting the normal performance of the hybrid or monolithic circuit. The probe (26) is removable and is introduced into the circuit for testing purposes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile